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Micro-Raman Spectroscopy in Thin Section Analysis of Rock Mineralogy

Aplikace | 2019 | MetrohmInstrumentace
RAMAN Spektrometrie
Zaměření
Materiálová analýza
Výrobce
Metrohm

Souhrn

Significance of the topic


The precise identification of mineral phases in rock thin sections underpins petrographic and petrologic studies across academic, government, and industrial laboratories. Traditional optical microscopy methods face limitations when grain sizes fall below 100 micrometers or when distinguishing chemically continuous solid-solution series and opaque minerals. Micro-Raman spectroscopy addresses these challenges by combining high spatial resolution with chemical specificity, offering a cost-effective, low-maintenance complement to standard petrographic techniques.

Objectives and overview of study


This application note demonstrates the use of a portable micro-Raman system for in situ mineral identification in rock thin sections. Key aims are to illustrate how micro-Raman analysis overcomes the limitations of transmitted-light microscopy, to provide semi-quantitative composition data for solid solutions, and to showcase an integrated setup based on commonly available petrographic microscopes.

Methodology and instrumentation


Instrumental setup:
  • B&W Tek i-Raman Plus module with 785 nm excitation laser and BWSpec/BWID software
  • Olympus BX-40 polarizing microscope with 10×, 50×, and 150× metallurgical objectives and XY mechanical stage

Method highlights:
  • Spot diameter: ~16 µm using high-NA objectives
  • Integration times: 2–10 seconds; 100% laser power for most acquisitions
  • Analysis of both polished (no cover slip) and covered sections, with recognition of glass slide and epoxy luminescence features
  • Seamless switch between optical and Raman modes by extinguishing microscope illumination during laser exposure

Main results and discussion


Opaque minerals: Raman spectra acquired from sub-100 µm opaque grains (e.g., Fe-oxides, sulfides) reliably match reference libraries, as shown for hematite where peak positions and intensities align with RRUFF data.

Solid-solution minerals:
  • Garnet series: Shifts in the A1g Si–O stretching band around 900 cm⁻¹ enable estimation of mole fractions in the almandine–spessartine series, indicating intermediate compositions (25–50 mol% spessartine).
  • Plagioclase feldspar: Diagnostic peaks at ~481 and 510 cm⁻¹ allow discrimination of andesine from oligoclase and labradorite, despite strong background luminescence from the mounting medium and slide.

Background features: Characteristic luminescence bands from glass slides and epoxy binders are readily identified and excluded from mineral assignments.

Benefits and practical applications of the method


Micro-Raman spectroscopy offers:
  • Sub-10 µm spatial resolution for fine-grain and accessory mineral identification
  • Chemical and polymorph discrimination within solid-solution series
  • Low acquisition cost (tens of thousands of dollars) versus SEM-EDS or EMP systems
  • Minimal annual maintenance, no dedicated climate-controlled space, no specialized technician required
  • Compatibility with existing petrographic microscopes and in-house thin-section preparation facilities

This approach enhances routine petrographic workflows in university geology departments, governmental surveys, and private consulting firms.

Future trends and potential applications


Emerging developments may include:
  • Automated spectral mapping and phase quantification across full thin sections
  • Integration of confocal and depth-profiling capabilities for three-dimensional mineral analysis
  • Real-time monitoring of mineral transformations under controlled environmental stages
  • Deployment in field-portable or planetary exploration instruments for remote geochemical characterization

Conclusion


Integrating micro-Raman spectroscopy with standard petrographic microscopes overcomes critical identification challenges in thin-section analysis. The technique provides high spatial resolution, chemical specificity, and semi-quantitative composition data at a fraction of the cost and complexity of electron-beam instruments. Its low maintenance footprint and ease of operation make it an attractive addition to any geology laboratory seeking enhanced mineral characterization capabilities.

Reference


  • Freeman JJ, Wang A, Kuebler KS, Joliff BL, Haskin LA (2008) Characterization of natural feldspars by Raman spectroscopy for future planetary exploration. Canadian Mineralogist 46:1477–1500.
  • Kolesov BA, Geiger CA (1998) Raman spectra of silicate garnets. Physics and Chemistry of Minerals 25:142–151.
  • Nasdala L, Smith DC, Kaindl R, Ziemann MA (2004) Raman spectroscopy: Analytical perspectives in mineralogical research. European Mineralogical Notes in Mineralogy 6:281–343.

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