Gaining Deeper Insights into Thin Film Response
Aplikace | 2022 | Agilent TechnologiesInstrumentace
NIR Spektroskopie, UV–VIS Spektrofotometrie
ZaměřeníMateriálová analýza
VýrobceAgilent Technologies
Klíčová slovanonuniformity, transmittance, losses, thin, oscillations, aoi, film, accessory, thickness, uma, reflectance, total, optical, wavelength, angles, universal, sample, measurement, films, random, months, difference, insights, does, using, nonabsorbing, spectral, contribute, fitted, later, acquire, data, different, spectra, transmission, designers, measured, francis, illuminates, unreported, theoretical, encyclopedia, burt, travis, capable, normal, same, experiment, reanalyzed, agilent
Podobná PDF
Optical Characterization of Materials Using Spectroscopy
2023|Agilent Technologies|Příručky
Applications of UV-Vis-NIR Optical Characterization of Materials Using Spectroscopy Application Compendium > Return to table of contents Table of contents Introduction 4 Optics 5 Characterizing Sub-Nanometer Narrow Bandpass Filters Evaluation of the Cary Specular Reflectance Accessory for…
Klíčová slova
optical, opticalreturn, returnreflectance, reflectancecontents, contentstable, tableangle, angleincidence, incidencemeasurements, measurementswavelength, wavelengthtransmittance, transmittancereflection, reflectionmeasurement, measurementspectrophotometer, spectrophotometercoating, coatingbeam
A Faster, More Accurate Way of Characterizing Cube Beamsplitters
2022|Agilent Technologies|Aplikace
Application Note Materials A Faster, More Accurate Way of Characterizing Cube Beamsplitters Using the Agilent Cary 7000 universal measurement spectrophotometer (UMS) Authors Abstract Travis Burt and Chris Colley Agilent Technologies Mulgrave, Victoria, Australia Cube beamsplitters (CBS) are critical optical components…
Klíčová slova
polarized, polarizedbeamsplitter, beamsplittercoating, coatingcbs, cbswavelength, wavelengthbeamsplitters, beamsplittersoptical, opticalcube, cubebeam, beampolarization, polarizationincident, incidentreflected, reflectedangle, angleillumination, illuminationcement
Optical Characterization of Thin Films
2022|Agilent Technologies|Aplikace
Application Note Materials Optical Characterization of Thin Films Using a Universal Measurement Accessory for Agilent Cary UV-Vis-NIR spectrophotometers Authors Robert Francis and Travis Burt Agilent Technologies, Inc. Mulgrave, Victoria Australia Introduction A more detailed account of this work was first…
Klíčová slova
angle, angleoptical, opticalfilms, filmsthin, thinincidence, incidenceengineering, engineeringuma, umamulti, multireverse, reversemeasurement, measurementcoatings, coatingsspectral, spectralreflectance, reflectancemultilayer, multilayeraccessory
Agilent Cary 7000 universal measurement spectrophotometer
2022|Agilent Technologies|Brožury a specifikace
Advance Your Materials Agilent Cary 7000 universal measurement spectrophotometer A More Powerful Approach to Measuring Solid Samples Do you measure the optical properties of coatings, thin films, optical components, solar cells, or glass? Do you measure reflectance AND transmission? Do…
Klíčová slova
optical, opticalreflectance, reflectancetransmission, transmissioncary, carynir, nirsolar, solarabsolute, absolutewavelength, wavelengthvis, viswinuv, winuvmeasurements, measurementsyour, yourmaterials, materialsscattering, scatteringmoving