Raw Materials ID and Counterfeit ID Workshop: Learn how Spatially Offset Raman Spectroscopy (SORS) Simplifies this Analysis
Agilent Technologies: Raw Materials ID and Counterfeit ID Workshop: Learn how Spatially Offset Raman Spectroscopy (SORS) Simplifies this Analysis
Designed to be used in a GMP-compliant warehouse, the Agilent Vaya Raman system accelerates the identification test by enabling raw-material testing through transparent and opaque containers.
Leveraging a patented optical design and algorithm, Vaya uses spatially offset Raman spectroscopy (SORS) technology to transform the reception of raw materials.
Presenter: Yanqia Wang, PhD (Application Engineer, Molecular Spectroscopy, Agilent Technologies, Inc.)
Dr. Yanqia Wang started working for Agilent Technologies Inc. as a FTIR application Engineer in 2013, providing pre-&post-sale application support. The products he covers from Bench-top FTIR microscopes to various Mobile FTIR spectrometers. Dr. Wang received his PhD of analytical chemistry from Duke University in 2004, doing dynamic IR spectroscopy research. Then he joined Fitzpatrick Center for Photonics at Duke University, doing Tissue Raman spectrometer instrumentation. Since 2007, Dr. Wang worked for Avery Dennison Corp. as a spectroscopist, providing molecular analytical support to the research & development.