Fourth North American SIFT-MS User Meeting - Day 1
Syft Technologies invites you to join the 2020 North American user group meeting focused on the latest applications of selected ion flow tube mass spectrometry (SIFT-MS).
SIFT-MS users present their latest data from across diverse fields from food chemistry to thermal desorption to workplace safety research.
Day 1 (Times are shown US EDT)
1pm Welcome and procedures (Dr Vaughan Langford, Syft Technologies)
1.10pm PLENARY From mold worms to fake honey: using SIFT-MS to improve food quality (Prof. Sheryl Barringer, The Ohio State University)
1.50pm Source apportionment and quantification of liquid and headspace leaks from closed system transfer devices via SIFT-MS (Dr Amos Doepke, Dr Robert Streicher, CDC/NIOSH/HELD/CBMB)
2.15pm refreshment break
2.30pm Principles of solid-phase microextraction and its use in food analysis (Prof. Emanuela Gionfriddo, University of Toledo)
2.55pm Time-resolved thermal extraction of volatiles from plastic materials using TD-SIFT-MS (Dr Christopher Pfaff, Syft Technologies (Europe))
3.20pm Novel authentication of single-origin green coffee beans and detection of adulteration using on-line SIFT-MS (Dr Hardy Castada, The Ohio State University)
3.45pm refreshment break
4pm Comparison of sample introduction techniques like static headspace, dynamic headspace and direct thermal extraction for analysis of rancidity markers in instant food using SIFT-MS and GC/MS (Kurt Thaxton, Thomas Langenberg, Dr Eike Kleine-Benne, GERSTEL)
4.25pm Finishing the 2019 story: Part 1. SIFT-MS as a sensory tool for packaging screening (Dr Vaughan Langford, Syft Technologies)
4.50pm Concluding remarks (Dr Vaughan Langford, Syft Technologies)
5pm close for Day 1
See more details including abstracts for all presentation at SIFT-MS User Meeting web page.
