A multi-platform approach for screening and quantitating pesticide residues in food

Quantification of trace levels of pesticides in food can be challenging. Identifying residual pesticides in complex matrices requires adequate sample workup and appropriate instrumentation.

Agilent offers a comprehensive workflow for pesticide screening and quantitation by combining QuEChERs sample preparation and multi-platform GC/MS analysis. This presentation will cover the workflows utilizing GC/MSD for pesticide screening and quantitation, targeted pesticide screening with enhanced sensitivity and selectivity with GC/TQ, and comprehensive trace-level screening and quantitation with retrospective analysis capabilities with high-resolution accurate mass analysis using GC/Q-TOF.

Key Learning Objectives/What attendees will learn:

• Suspect screening and quantitation by GC/MSD
• Targeted selective and sensitive quantitation by GC/TQ
• Trace level screening and quantitation by GC/Q-TOF

Who Should Attend:

Food scientists and chemists interested in pesticide analysis by GCMS

Presenter: Erinn O'Neill (GCMS Applications Scientist, Agilent)

Erinn O’Neill is a GCMS Pre-Sales Application Scientist for Agilent in Wilmington, Delaware. She graduated from the University of North Carolina at Chapel Hill with a Ph.D. in Chemistry in 2019, where she focused on identifying novel chemical structures synthesized by plant-pathogenic bacteria. Before that, she obtained a Bachelor’s degree in Chemistry from Drew University in New Jersey, where she studied reactions between atmospheric aerosol surrogates and trace pollutants.