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Drinking Water Semivolatiles Analysis using the 6890N/5975B inert GC/MSD

Aplikace | 2006 | Agilent TechnologiesInstrumentace
GC/MSD, GC/SQ
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Agilent Technologies
Klíčová slova
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Parts-per-Trillion Level Calibration of Semivolatiles Using LVI-PTV-GC/MSD Application Environmental Author Mike Szelewski Agilent Technologies, Inc. 2850 Centerville Road Wilmington, DE 19808 USA Abstract The analysis of semivolatiles in the parts-per-trillion range presents challenges due to analyte activity, background contamination, and…
Klíčová slova
ptv, ptvwashes, washestemp, tempsolv, solvvent, ventmsd, msdcryo, cryosemivolatiles, semivolatilesrtl, rtlpurge, purgecalibration, calibrationsim, simdichloromethane, dichloromethanesolvent, solventoven
Femtogram GC/MSD Detection Limits for Environmental Semivolatiles Using a Triple-Axis Detector Application Environmental Author Mike Szelewski Agilent Technologies, Inc. 2850 Centerville Road Wilmington, DE 19808 USA Abstract The analysis of semivolatiles at very low levels presents challenges due to analyte…
Klíčová slova
sim, simwashes, washessolv, solvscan, scanmsd, msdptv, ptvcryo, cryotemp, temppurge, purgesemivolatiles, semivolatilesoven, ovenpostinj, postinjpreinj, preinjpentachlorophenol, pentachlorophenolautosim
Fast USEPA 8270 Semivolatiles Analysis Using the 6890N/5975 inert GC/MSD Application Environmental Author Mike Szelewski Agilent Technologies, Inc. 2850 Centerville Road Wilmington, DE 19808 Abstract The analysis of semivolatiles using EPA Method 8270 presents challenges due to the simultaneous measurement…
Klíčová slova
msd, msdrtl, rtltemp, temprrfs, rrfsacross, acrosslinearity, linearityinlet, inletinert, inertfaster, fasterrun, runtime, timepulse, pulsesampling, samplingoutlet, outletoven
Fast USEPA 8270 Semivolatiles Analysis Using the 6890/5973 inert GC/MSD with Performance Electronics Application Environmental Analysis Author Mike Szelewski Agilent Technologies, Inc. 2850 Centerville Road Wilmington, DE 19808-1610 USA Abstract The analysis of semivolatiles using EPA Method 8270 presents challenges…
Klíčová slova
electronics, electronicsmsd, msdtemp, temprrfs, rrfsacross, acrossperformance, performancelinearity, linearityrrf, rrfmacro, macroinlet, inletfaster, fasterrun, runpulse, pulsesystem, systemsampling
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